Metrology for Semiconductors TXRF, WDXRF

Semiconductor and electronics manufacturing relies heavily on metrology for quality control, accurate measurements and process optimization. It ensures reliability, reduces defects and drives innovation in materials, design and manufacturing techniques. Semiconductor metrology enables accurate measurement and analysis of materials and devices, ensuring compliance with manufacturing specifications, facilitating defect troubleshooting, and characterizing device performance. In R&D departments, it facilitates materials development, prototyping and innovation, advancing manufacturing processes and ultimately driving the evolution of electronic devices.

Rigaku TXRF 3760

TXRF - Surface Contamination Metrology

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Rigaku Wafer Disk Analyzer WDA-3650

WDXRF - Simultaneous Spectrometers

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