XRD Diffractometers

X-ray powder diffraction (XRD) allows the determination of the crystal structure of materials, the identification of phases in a sample and their weight quantification; the study of amorphous and the degree of crystallinity of components.

Some other applications:

Analysis of thin films and measurement of their thickness by reflectometry in the semiconductor and optoelectronics industry

Analysis of residual stresses and textures in metal alloys

Kinetic and phase transformation studies with low- and high-temperature chambers

Microdiffraction with spots down to a minimum of 10 microns with high-brightness rotating anode generators